1、深圳市鑫冠明科技有限公司1SHAN ZHEN SHI XIN GUAN MING Customer : Part No : 5050-03-WWWCDeveloped No : Date : CUSTOMER APPROVED BYAPPROVED Q.C. R&D深圳市鑫冠明科技有限公司2_ Outline Dimension: 213456123456 View Angle:1Notes:1. All dimensions are in millimeters.2. Tolerance is 0.2 unless otherwise noted.3. Specifications are
2、subject to change without notice.SPATIL DRIBUON0.680.315201346789深圳市鑫冠明科技有限公司3Typical Electrical & Optical Characteristics(Ta=25)Items Symbol Condition Device Min Typ Max UnitChip1 3.0 3.4 VChip2 3.0 3.4 VForward Voltage VF IF =20mAChip3 3.0 3.4 VChip1 - - 5 AChip2 - - 5 AReverse Current IR VR =5VCh
3、ip3 - - 5 AChip1 6000 6500 KChip2IF =20mAChip3Chip1 6000 6500 KChip2TC（K）IF =20mAChip3Chip1 mcdChip2 mcdLuminous Intensity Iv IF =20mAChip36300 7000mcdView Angle 21/2 IF =20mA - 120 - Deg Absolute Maximum Ratings (Ta = 25)Items Symbol Absolute maximum Rating UnitPower Dissipation PD 120 mWForward Cu
4、rrent(DC) IF 30 mAPeak Forward Current IFP 150 mAReverse Voltage VR 5 VOperation Temperature Topr 4085 Storage Temperature Tstg 4085 深圳市鑫冠明科技有限公司4Note :1/10 Duty Cycle，0.1 ms Pulse Width. Typical Electrical/Optical Characteristics Curves:3.24.05041362.80 9084.2306-510.043250432110860908.5201.64-761.
5、20.8WavelngthVs.RiIy深圳市鑫冠明科技有限公司5 Reliability Test :Classification Test Item Test Conditions Duration UnitsTested Number of DamagedLife Test Operating Life TestTa =255,RH=5520%RH,IF=30mA1000hrs 22 0/22High Temperature Storage Ta =10010 1000hrs 22 0/22Low Temperature Storage Ta =40 +3 -51000hrs 22 0/
6、22Temp &Humidity Storage Ta =85 +5 -3RH=85 %RH+ -5 10 1000hrs 22 0/22Thermal Shock TestTa=40 +5 -3100 +3 -5T=5min - 5min100Cycles 22 0/22EnvironmentTestTemperature Cycling TestTa=40 +3 -52510025+5 -3T=30min-5min-30min- 5min10Cycles 22 0/22深圳市鑫冠明科技有限公司6 Recommended Soldering Pattern:( Units:mm) Tape Specifications:(Units:mm)深圳市鑫冠明科技有限公司7TAPE123456
