1、催化剂表征技术术语一览表英文名称 中文名称Sieving 筛分法Optical microscopy 光学显微镜法Scanning electron microscopy（SEM ）扫描电镜法Transmission electron microscopy (TEM)透射电镜法Scanning TEM (STEM) 扫描透射电镜法Scanning tunneling microscopy (STM)扫描隧道显微镜Scanning force microscopy (SFM) 扫描力显微镜Gravitaional sedimentation 重力沉降法Resistive pulsed 电阻法Li
2、ght obscuration 光透法Fraunhofer diffraction 夫琅和费衍射法Cetrifugal sedimentation 离心沉降法Photon correlation spectroscopy(PCS)光子相关光谱分析法Hydrodynamic 流动色层分析法chromatography(HCD)Field flow fractionation(FFF) 场流分离法BET method BET 法Small angle X-ray scatiering(XSAS) X-射线小角度散射法Chemisorption 化学吸附法Adsorption-Titration m
3、ethod 吸附-滴定法Mercury porosimetry(Merc) 压汞法Incipient wetness 初湿含浸法Permeametry 渗透测粒法Counterdiffusion 反扩散法Small angle neutron scatiering(NSAS) 中子小角散射法Volumetric adsorption 体积吸附法Gravimetric adsorption 重量吸附法Dynamic adsorption 动态吸附法Calorimetry(Cal) 量热法IR-spectroscopy(IR) 红外光谱法Raman spectroscopy 拉曼光谱法UV-Vis
4、 spectroscopy(UV-Vis) 紫外-可见光光谱法Mass spectrometry (Mass) 质谱Atomic absorption 原子吸收光谱spectroscopy（AAS）Auger electron spectroscopy (AES) 俄歇电子能谱Electron spectroscopy for chemical analysis (ESCA)化学分析电子能谱X-ray photoelectron spectroscopy（XPS ）X 射线电子能谱Uv-photoelectron spectroscopy（UPS）紫外光电子能谱Energy dispersiv
5、e spectroscopy (EDS) 能量色散谱Wavelength dispersive spectroscopy (WDS)波长分散谱Mossbauer spectroscopy 穆斯堡尔谱Electron spin resonance (ESR) 电子自旋共振Electron Paramagnetic Resonance(EPR)电子顺磁共振Nuclear magnetic resonance (NMR) 核磁共振Thermal gravimetric analysis (TGA) 热重分析Differential thermal analysis (DTA) 差热分析Differe
6、ntial scanning calorimetry (DSC)差示扫描量热计法Thermomechanical analysis (TMA) 热机械分析Temperature programmed desorption(TPD)程序升温脱附Temperature programmed oxidation(TPO)程序升温氧化Temperature programmed reduction(TPR)程序升温还原Temperature programmed surface reaction(TPSR)程序升温表面反应X-ray diffraction (XRD) X 射线衍射Extended x
7、-ray absorption fine structure (EXAFS)扩展 X 射线吸收精细结构Near-edge x-ray adsorption fine structure (NEXAFS)近边 X 射线吸收精细结构Surface extended x-ray adsorption fine structure (SEXAFS) 表面扩展 X 射线吸收精细结构Electron energy loss spectroscopy (EELS)电子能量损失谱Low-energy electron diffraction (LEED)低能电子衍射Reflection high-energy
8、 electron diffraction (RHEED)反射高能电子衍射Magnetic force microscopy (MFM) 磁力显微镜Secondary ion mass spectroscopy (SIMS)二次离子质谱Surface enhanced raman spectroscopy (SERS)表面增强拉曼光谱Elemental Analysis 元素分析Electron probe microanalysis (EPMA) 电子探针微分析Flame photometry 火焰光度法X-ray fluorescence（XRF） X 射线荧光Inductively Coupled Plasma-Mass Spectrometer (ICP-AES)电感耦合等离子体发射光谱Electron diffraction 电子衍射Neutron diffraction 中子衍射Optical rotatory dispersion (ORD) 旋光色散Rutherford back scattering (RBS) 卢瑟福背散射
