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IEEE有关低压交流电源中冲击环境的描述-1引言.pdf

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1、IEEE Introduction of surge environment in low-voltage AC power circuits in IEEE IEEE IEEE C62.41.1-2002 IEEE C62.41.2-2002 IEEE C62.45-2002 0.5 s-100 kHz 1.2/50-8/20 s EFT 10/1000 s 0.5 s-100 kHz 1.2/50-8/20 s EFT 10/1000 s Abstract The trilogy standards of surge environment in low-voltage AC power

2、circuits sponsored by surge protective devices committee, power engineering society IEEE was introduced in this paper. The trilogy standards include IEEE C62.41.1 IEEE guide on the surge environment in low-voltage (1000 V and less) AC power circuits , IEEE C62.41.2 IEEE recommended practice on chara

3、cteristics of surges in low -voltage (1000 V and less) AC power circuits and IEEE C62.45 IEEE recommended practice on surge testing for equipment connected to low -voltage (1000 V and less) AC power circuits . Two standard waveforms including 0.5 s-100 kHz ring wave and 1.2/50-8/20 s combination wav

4、eform, and two additional surge-testing waveforms including EFT burst and 10/1000 s long wave are mentioned in the standards. The selection of peak surge is according to location category and exposure. Finally, the definition of the waveforms and equations for simulation are also introduced. Key wor

5、ds: Low-voltage AC power circuit; surge environment; 0.5 s-100 kHz ring wave; 1.2/50-8/20 s combination waveform; EFT burst; 10/1000 s long wave 1. 1980 IEEE IEEE C62.41 1000 V 1991 IEEE C62.41-1991 1980 0.5 s-100 KHZ 1.2/50-8/20 s 2002 IEEE C62.41 1 3 IEEE C62.41.1-2002 IEEE C62.41.2-2002 IEEE C62.

6、45-2002 2. 3. 1 2 1 2 SPD 1 A B C 1 IEEE C62.41.1P15 8 1 4. IEEE The criterion of validity of an environment standard is not so much how closely it duplicates reality but rather how well equipment designed in accordance with this standard perform in the field. If equipment designed in accordance wit

7、h the standard perform well in the field, while equipment ignoring the standard do not perform well, the chances that the standard is a good standard are pretty good. 1 0.5 s-100 KHZ 1.2/50-8/20 s EFT 1000 s , 1 1 A B C 1 2 1 2 100 KHZ / EFT 5/50 ns 10/1000 s A - B - C - C - - B 2 IEEE C62.41.2 A IE

8、C 10/350 s SPD 2 SPD 2 SPD X SPD 1 2 SPD 10/350 s 8/20 s 10 2 SPD 2 SPD 10/350 s MOVS SPD 8/20 s 1 2 kA 20 kA 2 5 kA 50 kA 3 10 kA 100 kA X A SPD SPD B SPD C 1 SPD 3-8 3 0.5 s-100 KHZ A B L-N L-G L / 10 2 ; 788 . 9 ; 533 . 0 ) cos( ) exp( ) exp 1 ( ) ( 5 4 1 2 1 2 1 = = = = = a s rad s s t t t AV t

9、V p 5.2 1.2/50 s 8/20 s 1.2 s 0.36 s 1.67 t 90 -t 30 50 s 10 s 50% 90 30 037 . 1 ; 22 . 68 ; 4074 . 0 ) exp( ) exp 1 ( ) ( 2 1 2 1 = = = = A s s t t AV t V p 3 1.2/50 s 8 s 1.0 2.5 s 1.25 t 90 -t 10 20 s 8 4 s 50% 90 10 3 3 ) ( 01243 . 0 ; 911 . 3 ) exp( ) ( = = = s A s t t AI t I p 4 8/20 s = 25 .

10、0 0 . 2 / p p I V 10 5.3 EFT 5 ns 1.5 ns 10 90 50 ns 15 ns 50 15 ms 3 ms 2 kV: 5 kHz 1 kHz 2 KV: 2.5 kHz 0.5 kHz 300 ms 60 ms 5 EFT 270 . 1 ; 6 . 55 ; 5 . 3 ) exp( ) exp 1 ( ) ( 2 1 2 1 = = = = A s s t t AV t V p 50 10 5.4 10/1000 s 10 s(+0,-5) s 1.25 t 90 -t 10 1000 s( 1000 0) s 10 s(+0,-5) s 1.25

11、t 90 -t 10 1000 s200 s 019 . 1 ; 1404 ; 827 . 3 ) exp( ) exp 1 ( ) ( 2 1 2 1 = = = = A s s t t AI t I p 10 6 10/1000 s 5.5 10/350 s 10 s 1.25 t 90 -t 10 350 s 051 . 1 ; 1 . 470 ; 103 . 4 ) exp( ) exp 1 ( ) ( 2 1 2 1 = = = = A s s t t AI t I p 6 IEEE IEEE C62.41.1-2002 IEEE C62.41.2-2002 IEEE C62.45-

12、2002 0.5 s-100 kHz 1.2/50-8/20 s EFT 10/1000 s 1 IEEE C62.41.1 IEEE guide on the surge environment in low-voltage (1000 V and less) AC power circuits 2002 2IEEE C62.41.2 IEEE recommended practice on characteristics of surges in low -voltage (1000 V and less) AC power circuits , 2002 3IEEE C62.45 IEEE recommended practice on surge testing for equipment connected to low -voltage (1000 V and less) AC power circuits , 2002 1968 6278 4709 Email:

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