1、 Tablet-S HW/Reliability test spec Version V1.7 Document Number MIDH- S- TPD. -xxx Release Date 2012-08-24 Review Cycle 1 year Page 1 of 101 The online version is the master. Tablet-S HW/Reliability Test Spec This document was approved for general use on the indicated date of issue. The user of this
2、 document is responsible for obtaining the master/latest version on-line prior to use. The latest version of this document is located at ECM. If this is a printed hardcopy, its for reference only. Users that have recommended process changes should send them via e-mail to the process owner. . Documen
3、t Control Owner and Approver Owner Department Approver Department Gu Jianming PA Liu Yue PA Reviewer Revision Table Version Revision Date Summary of Changes Revised by Department V1.7 2012/8/28 1. Transfer document format; 2. Add tear down item for mechanical design review; 3. Split op temp/humid cy
4、cle test item to operating at high temp, operating at low temp and operating at high temp high humid test; 4. Split non-op temp/humid cycle test item to storage at high temp, storage at low temp test and storage at high temp high humid test; 5. Add salt fog test 2h spray, 22h storage test condition
5、for unit system check; 6. Add resistance to metal particles test item for speaker mesh check; 7. Add heat with solar radiation test item (optional item) for touch panel and painting check; 8. Define the package environment storage test and test sequence; 9. Add LCD ripple check form the touch panel
6、and back cover; 10. Add display sticking force test item to check touch panel , LCD and front frame 3 in 1 bound process of Gu Jianming Tablet PA Department Name Department Name Tablet-S HW/Reliability test spec Version V1.7 Document Number MIDH- S- TPD. -xxx Release Date 2012-08-24 Review Cycle 1 y
7、ear Page 2 of 101 The online version is the master. supplier; 11. Change ball drop test height from 30cm to 20cm; 12: Change free fall drop 76cm height and 100cm height test tablet from wooden to concrete; 13. Add tumbling drop test item; 14. Add Silica gel pressing test item; 15. Add silent alert t
8、est item check vibra motor; 16. Add repeatable drop test item; 17. Add accessory endurance test (for adapter and headset ); 18. Add appendix 1 baseline full check list; 19. Add appendix 2 package full check criteria; Tablet-S HW/Reliability test spec Version V1.7 Document Number MIDH- S- TPD. -xxx R
9、elease Date 2012-08-24 Review Cycle 1 year Page 3 of 101 The online version is the master. I. Purpose This document is to define HW/Reliability test spec for Tablet product which size 7”. II. Scope This document is designed to provide detailed instructions for conducting HW/Reliability test, which c
10、ontains detailed information for each test items purpose, units quantity, executing procedure and judge criteria. It can be applied and followed for Lenovo Tablet product, including ODM and In-house project III. Roles Testing team should understand and follow the spec well; Any query on the document
11、, pls contact with PA owner for the clarification. IV. Terms 5) Take a call that check contact function was well experience. 6) Detail baseline check list, please refer attach Appendix 1 for full check Pass/Failure Criteria SD card, SIM card recognition error, or data transfer/contact error; Touch p
12、anel no function, slow response, position error or partly area no function; LCD issues: Non-uniformity smudges, Glass crack, Horizontal/ vertical Line failure, ripple, light leakage, white spot; RF function was not stable, signal data cant meet design and market requirement; System cant power on or
13、power on out time; I/O port no function or partly function lost; Badly user experience for power, volume or other button; Binding or slackening of moving parts; Differential contraction or expansion of dissimilar materials; Deformation or fracture of components; Cracking of surface components; Any c
14、orrosion or dendritic growth on screws, connectors, etc.; Any stiffness or weakness when pressing a button; Any loss of adhesion between mechanical parts and rubber material Tablet-S HW/Reliability test spec Version V1.7 Document Number MIDH- S- TPD. -xxx Release Date 2012-08-24 Review Cycle 1 year
15、Page 9 of 101 The online version is the master. 1.2. Tear down Back Test Purpose Preliminary observation for mechanical cosmetic status. Need disassemble test unit, check any mechanical design risk assess and some unfit user experience issue review. Test Equipment NA Test unit Quantity: Minimum 2pcs
16、 test units Test Procedure Note 1: Ambient room: temperature 25 2 and a relative humidity of 50% 10% 1) Perform a complete visual inspection, looking for the cosmetic gaps, warping and corrosion etc. 2) Confirm disassembly SOP for the correct method, then start tear down 3) Evaluate the test units d
17、esign risk/ leakage, such as mechanical interference between different pats, weakness mechanical protection, and foreign material issue, etc. 4) Check production process for assembly line and SMT; 5) Highlight to RD team and record issue, create into issue system. Pass/Failure Criteria Binding or sl
18、ackening of moving parts Differential contraction or expansion of dissimilar materials Deformation or fracture of components Cracking of surface components Any corrosion or dendritic growth on screws, connectors, etc. Any stiffness or weakness when pressing a button Any loss of adhesion between mech
19、anical parts and rubber material Structure interference between the different part and component Unreasonable design caused the component damage risk, poor operational for mass production Tablet-S HW/Reliability test spec Version V1.7 Document Number MIDH- S- TPD. -xxx Release Date 2012-08-24 Review
20、 Cycle 1 year Page 10 of 101 The online version is the master. 2. Environment Endurance test 2.1. Operating at high temperature Back Test Purpose This test objective is to subject the test unit (production-shipping standards), and AC adapter to operational stresses under high temperature and humidit
21、y, to ensure the properly function of test unit even when it is used by the customer in unfriendly environment Test Equipment Walk- in chamber Test unit quantity: Minimum 2 units per configuration and min 5pcs units overall for this test Test Procedure Note 1: System selected for test shall be inclu
22、de all type TP, LCD, Battery, CPU, eMMC, Memory, Camera, OS, AC adapter, and docking test together if it ship requirement in AVL. Note 2: inspection All test units running Diagnostics software under room temperature All test units shall plug the adapter to check the charger/discharger function is no
23、rmally, and be capable of powering on/down Unit shall have fully charged batteries for overall test process complete Making a call (if applicable), connect to network and have a successful data session prior to the start of test. Connect through the WLAN network, check that has a successful data tra
24、nsfer, and take a read from SD card, confirm connect normal; Manually operate the system to confirm its touch function works normally, as well as LCD display; System operational and ensure that the Input/ output port function can be detected Note 3: Test chamber maximum temperature transition rate i
25、s 15oC/hr and maximum humidity transition rate is 20%/hr Test step Step 1: Test program: running Diagnostics software under room temperature check function works normally. Step 2: Test units power on Step 3: Place test unit into walk-in chamber by diagnostics software is ongoing and setting walk-in
26、chamber work condition as 40 C/45% RH, complete 48 hours test. Step 4: Check test unit status as Note 2 defined after cycles has completed. Pass/ Failure Criteria More than 2-second deviation in RTC in a 24-hour period; SD card, SIM card recognition error, or data transfer/contact error; Touch panel
27、 no function, slow response, position error or partly area no function; Tablet-S HW/Reliability test spec Version V1.7 Document Number MIDH- S- TPD. -xxx Release Date 2012-08-24 Review Cycle 1 year Page 11 of 101 The online version is the master. LCD issues: Non-uniformity smudges, Glass crack, Hori
28、zontal/ vertical Line failure, ripple, light leakage, white spot; System cant power on or power on out time; I/O port no function or partly function lost; Badly user experience for power, volume or other button; Test units inability to place a call (if applicable) and have not successful data sessio
29、ns, malfunctioning displays, keypads, speakers, camera, interface; Tablet-S HW/Reliability test spec Version V1.7 Document Number MIDH- S- TPD. -xxx Release Date 2012-08-24 Review Cycle 1 year Page 12 of 101 The online version is the master. 2.2. Operating at low temperature Back Test Purpose This t
30、est objective is to subject the test unit (production-shipping standards), and AC adapter to operational stresses under low temperature , to ensure the properly function of test unit even when it is used by the customer in unfriendly environment Test Equipment Walk- in chamber Test unit quantity: Mi
31、nimum 2 units per configuration and min 5pcs units overall for this test Test Procedure Note 1: System selected for test shall be include all type TP, LCD, Battery, CPU, eMMC, Memory, Camera, OS, AC adapter, and docking test together if it ship requirement in AVL. Note 2: inspection All test units r
32、unning Diagnostics software under room temperature All test units shall plug the adapter to check the charger/discharger function is normally, and be capable of powering on/down Unit shall have fully charged batteries for overall test process complete Making a call (if applicable), connect to networ
33、k and have a successful data session prior to the start of test. Connect through the WLAN network, check that has a successful data transfer, and take a read from SD card, confirm connect normal; Manually operate the system to confirm its touch function works normally, as well as LCD display; System
34、 operational and ensure that the Input/ output port function can be detected Note 3: Test chamber maximum temperature transition rate is 15oC/hr and maximum humidity transition rate is 20%/hr Test step Step 1: Test program: running Diagnostics software under room temperature check function works nor
35、mally. Step 2: Test units power on Step 3: Place test unit into walk-in chamber by diagnostics software is ongoing and setting walk-in chamber work condition as -10 C, complete 2hours test, and then setting walk in chamber work condition as 0 C, complete 48hours test. Step 4: Check test unit status
36、as Note 2 defined after cycles has completed. Pass/ Failure Criteria More than 2-second deviation in RTC in a 24-hour period; SD card, SIM card recognition error, or data transfer/contact error; Touch panel no function, slow response, position error or partly area no function; LCD issues: Non-unifor
37、mity smudges, Glass crack, Horizontal/ vertical Line failure, ripple, light leakage, white spot; System cant power on or power on out time; I/O port no function or partly function lost; Badly user experience for power, volume or other button; Tablet-S HW/Reliability test spec Version V1.7 Document N
38、umber MIDH- S- TPD. -xxx Release Date 2012-08-24 Review Cycle 1 year Page 13 of 101 The online version is the master. Test units inability to place a call (if applicable) and have not successful data sessions, malfunctioning displays, keypads, speakers, camera, interface; Tablet-S HW/Reliability tes
39、t spec Version V1.7 Document Number MIDH- S- TPD. -xxx Release Date 2012-08-24 Review Cycle 1 year Page 14 of 101 The online version is the master. 2.3. Storage at high temperature Back Test Purpose This test is to subject the test unit (production-shipping standards), and AC adapter to storage stre
40、sses under high temperature and humidity, to simulate storage and transportation by truck, train, ship and airplane Test Equipment Storage chamber Test unit Quantity Minimum 2 units per configuration and min 5pcs units overall for this test Test Procedure Note 1: System selected for test shall be in
41、clude all type, TP, LCD, Battery, CPU, eMMC, Memory, Camera, OS, AC adapter, and docking test together if it ship requirement in AVL Note 2: inspection a. All test units running Diagnostics software under room temperature b. All test units shall be inspected for visual and mechanical integrity, need
42、 overall mechanical gap, overlap data record and write in test report, confirm with ME dimension standard for result judgment; c. All test units shall plug the adapter to check the charger/discharger function is normally , and be capable of powering on/down d. Fully charged batteries, and check batt
43、ery capacity change after storage test complete, record into report, confirm with power team for power leakage specification; e. Battery swelling must be noted in report, the swelling percentage must in 8% and poor fitting of battery in housing due to battery swelling is not allowed; f. Making a cal
44、l (if applicable), connect to network and have a successful data session prior to the start of test. Connect through the WLAN network, check that has a successful data transfer, and take a read from SD card, confirm connect normal; g. Manually operate the system to confirm its touch function works n
45、ormally, as well as LCD display; h. Manually push side key to check for stiffness or weakness. i. System operational and ensure that the Input/ output port function can be detected; Note 3: Test chamber maximum temperature transition rate is 15oC/hr and maximum humidity transition rate is 20%/hr Tes
46、t step Step 1: Test program: running Diagnostics software under room temperature before storage test Step 2: Test units should be power off Step 3: Place test units into storage chamber table and setting chamber work condition as 60C/20% RH, complete 48hours test. Step 4: Check test units as Note 2
47、defined after cycles has completed. Pass/Failure Criteria More than 2-second deviation in RTC in a 24-hour period; System cant power on or power on out time; I/O port no function or partly function lost; Tablet-S HW/Reliability test spec Version V1.7 Document Number MIDH- S- TPD. -xxx Release Date 2
48、012-08-24 Review Cycle 1 year Page 15 of 101 The online version is the master. Badly user experience for power, volume or other button; RF function was ont stable, signal data cant meet design and market requirement; SD card, SIM card recognition error, or data transfer/contact error; Touch panel no
49、 function, slow response, position error or partly area no function; LCD issues: Non-uniformity smudges, Glass crack, Horizontal/ vertical Line failure, ripple, light leakage, white spot; Binding or slackening of moving parts; Differential contraction or expansion of dissimilar materials; Deformation or fracture of components; Cracking of surface components; Any corrosion or dendritic growth on screws, connectors, etc.; Any sti
