1、null ISSN1672 - 4305CN12- 1352 /N L null null null null i null null S null null LABORATORYnull SC IENCE 13 null 3 null 2010 M 6Volnull13null Nonull3 null Junnull2010OTL功放实验效率低下的原因及解决方案葛有根(安徽师范大学null 物电学院, 安徽 芜湖null 241000)K null 1 : OTL b L C M . v f , 4 v L C i s L , s , c d , i ! 9 1 p L b1 o M :
2、OTL; q bv ; S m s | : TN 108. 7null null D S M : Anull null do :i 10. 3969 / .j issn. 1672- 4305. 2010. 03. 023Reasons and solutions to low efficiency in OTL power circuit expermi entGE You- gen( College o f Physics and E lectron In form ation, Anhu iNorm alUn iversity, W uhu 241000, Ch ina)Abstract
3、: The prob lem that the experim entalm easure value is far from theoretical va lue in OTL pow ercircuit experim en.t On the basis o f observ ing huge experim ent phenom ena and ana lysing of a largenum ber of experim enta l data, a reasonable explanation is g iven and the practical c ircuit is desig
4、ned tom eet the theoretica l requ irem en.tKey words: OTL; comp lem entary pow er am plifier c ircu i;t dynam ic rangenull null OTL q bv null E L AS $ L 1- 2 ,T w q bv # Y aJ Y q bv V OTL , 1 7 b M L T B X b1null 5 e OTL m 1 U b X f / K v q a5 # r q 2- 3 :m 1null 1 OTL K v q : Pom = 18 V2CCRL ,5 : P
5、T = 2RLVCC2vomnull -v2om4K v q H r q :null = null4 vomVCC /2= null4 = 78. 5% L V : L = L rq 30%P , M . 4- 5b2null OTL q b v r q / y s y B : - ) S , OTL qbv L r q / 1 y b I n 1 f / , m 1 b X / , 5 V2aV 3 ( 2 = 3arbe2 = rbe3 )B b I n RC null R1 + Ra 2RL ( 3RL ) nullrbe2 ( rbe3 )a# RL l V1 E b 9 a E Z
6、L ,| m 1 r m 2b5 V 1 E Ro1 = RC / / rbe2 + (1 + 2 )RL , ( !VU i ,/ )b I n 2 1a 2RL null rbe2 ,5Ro1 = RC / / 2RL by N , V 1 S v1om m 2null 9 a E r mv1om = VCC 2RLRC + 2RL( 1)B f / , 2RL null RC , v1om = VCC b q bv 7 , RL l , 2RL V , v1om : vom = v1om /2 = 1. 2Vb v N 9 OTL : Pom = 0. 09(W ) , PT = 0.
7、149(W ) , null= 37. 7% b 6 , w 5 H r q 6- 7bL 4 C 9 ? 5 : ( a) L K v r VCC /2b( b) C d H / C d bC ( a) S ,C ( b) r q ? e B w 5 b y = : H B - ) S bm 1 K VCC /2 H , - ) V1 “ : VC1 =VCC /2- Vbe2 , T by N ,m 1V1 S :v1om = VCC - 2Vbe2 2RLRC + 2RL( 2)T ( 2) T ( 1) Vbe2 , A 5 1null2V 1. 4VbVbe2 | 0. 7V T (
8、 2 ) v1om =1null75V, 5 null = null4 vomVCC /2= 27. 5% b L 9 T d b3null % Z 8 , OTL r q / y : - ) S bA , V / Z E :9 v RL ; w 5 ; h l RC b9 v RL q bv “ M ;h l RC , A F - ) ,9 P r q bZ B : 5 9 v w ) bB tL = s Y b S , m 3 U bm V2aV 4 V3aV5 w 5 , I n y , 5 9 m : = 2 4 3 5 ( 2a 3a 4 5 V2aV3aV4 V5 9 m )b 6
9、 , - ) 5 , r T h l RCM ,# R 8bm 3null 5 OT L mZ = : ) b L s 5 B 4 b V I n | - ) ( - ) w ) W F B) ) ), E F l , V 7 r h l null RC 9 v S “ b m 4 U bm 4null ) 4 OT L r q 9 F ) V2, P RL V1 S Y V b H , ) w ) W E , H Y bC 1aR 1 1 ,i Y Q T b H , K VK V CC /2, y ( M ) P VK # ,5 9 - 10 :Vb1 # Vc1 % Vb2% Ve2 %
10、 Vb3% VK % Vb1 % Q , K P VK t b 1 : R1 i P VK M Y V1 V B 1; 6 B Z , VK M i d l M , y 7 , C19 id by N , C1aR 1 i P Q b Q L V , null ( 50%64葛有根: OTL功放实验效率低下的原因及解决方案 b O K v - VCC b4null OTLw q bv r q / y , C S , L , y ) bv ! 9 5 , - ) W E F E F 7- 8 b , L l , L T C M c H , F b N V n , n L M s s 9- 10b
11、 I D ( Re ferences): 1 null R . 0 L $ L M . : ,1986. 2 null B ; . 0 / $ M . : , 1988. 3 null f b , v . OTL ! 9 J . v ,2007, 24 ( 6): 114 - 116. 4 null d . q bv 1 T _ s J. , 4 , , . 1 K v q . 5 ) J. 0 , 2008 ( 1): 19 - 22. 8 null . 0 L 8 L v ! 9 J. 0 ,2008( 6): 49 - 52. 9 null n . , M S , . 3 9 ? V W y T ; T M aM T aM 1 1 b L X s 0 , , o , . LB / U ! J. , 2005, 19( 1 ): 6- 8.l : 2010- 03- 23T e : S ( 1963- ) , 3 , ao , p V , q , 1 Z _ ? b65
